An alternative method for simultaneously measuring cell parameters of a twisted-nematic liquid crystal cell

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 5, Issue 5, 2008, Pages 1023-1026

  Chen, Kun Huang ^a   Chen, Jing Heng ^a   Lin, Jiun You ^b   Su, Der Chin ^c   Su, Jung Chieh ^d  

^a FENG CHIA UNIVERSITY   (Taiwan)

^b NATIONAL CHANGHUA UNIVERSITY OF EDUCATION   (Taiwan)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE METHODS; AZIMUTH ANGLES; CELL GAPS; CELL PARAMETER; CELL-BASED; CIRCULARLY POLARIZED; COMMON PATH; HIGH RESOLUTION; HIGH STABILITY; INTERFERENCE SIGNAL; JONES CALCULUS; LIGHT BEAM; MEASURING CELLS; OPTICAL CONFIGURATIONS; PHASE DIFFERENCE; PHASE-SENSITIVE METHODS; THREE PARAMETERS; TWIST ANGLES; TWISTED NEMATIC;

CALCULATIONS; HETERODYNING; INTERFEROMETRY; LIQUID CRYSTALS; LIQUIDS; NUMERICAL ANALYSIS; PERSONAL COMPUTERS; SPECTROSCOPIC ELLIPSOMETRY;

NEMATIC LIQUID CRYSTALS;

EID: 65249111333     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200777738     Document Type: Conference Paper

References (17)

1. H. K. Liu, J. A. Davis, and R. A. Lilly, Opt. Lett. 10, 635 (1985).
2. F. T. S. Tu, S. Jutamulia, and X. L. Huang, Appl. Opt. 25, 3324 (1986).
3. D. A. Gregory, Appl. Opt. 25, 467 (1986).
4. T. H. Barnes, T. Eiju, K. Matsuda, H. Ichikawa, M. R. Taghizadeh, and J. Turunen, Appl. Opt. 31, 5527 (1992).
5. J. Amako and T. Sonehara, Jpn. J. Appl. Phys. Part 2 29, L1533 (1990).
6. F. Mok, J. Diep, H. K. Liu, and D. Psaltis, Opt. Lett. 11, 748 (1986).
7. C. Stolz, L. Bigue, and P. Ambs, Appl. Opt. 40, 6415 (2001).
8. S. T. Tang and H. S. Kwok, J. Appl. Phys. 89, 80 (2001).
9. J. N. Hilfiker, C. Herzinger, T. Wagner, A. Marino, G. Delgais, and G. Abbate, Thin Solid Films 455/456, 591 (2004).
10. J. N. Hilfiker, B. Johs, C. M. Herzinger, J. F. Elman, E. Montbach, D. Bryant, and P. J. Bos, Thin Solid Films 455/456, 596 (2004).
11. M. Schubert, B. Rheinläder, J. A. Woollam, B. Johs, and C. M. Herzinger, J. Opt. Soc. Am. A 13, 875 (1996).
12. M. Schubert, Thin Solid Films 313/314, 323 (1998).
13. G. Abbate, V. Tkachenko, A. Marino, F. Vita, M. Giocondo, A. Mazzulla, and L. De Stefano, J. Appl. Phys. 101, 073105 (2007).
14. C. C. Tsai, C. Chou, C. Y. Han, C. H. Hsieh, K. Y. Liao, and Y. F. Chao, Appl. Opt. 44, 7509 (2005).
15. J. Y. Lee and D. C. Su, J. Opt. 29, 349 (1998).
16. F. H. Yu and H. S. Kwok, J. Opt. Soc. Am. A 16, 2772 (1999).
17. M. H. Chiu, J. Y. Lee, and D. C. Su, Appl. Opt. 38, 4047 (1999).