Room temperature properties of electrical contacts to alumina composites containing silicon carbide whiskers

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  Bertram, Brian D ^a   Gerhardt, Rosario A ^a  

^a Georgia Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA COMPOSITES; ATOMIC FORCES; BARRIER HEIGHTS; CHARGE CARRIER CONCENTRATIONS; COMPLEX IMPEDANCES; CONTACT MATERIALS; CURRENT MODES; DC BIAS; DEGREE OF NONLINEARITIES; ELECTRICAL CONTACTS; ELECTRICAL PROPERTIES; ELECTRICAL RESPONSE; ELECTRODE PROPERTIES; EQUIVALENT CIRCUIT MODELS; EXPONENTIAL DEPENDENCES; EXPONENTIALS; IMPEDANCE SPECTROSCOPIES; METAL CONTACTS; METAL WORK FUNCTIONS; RELAXATION FREQUENCIES; RESISTOR CAPACITORS; ROOM TEMPERATURE PROPERTIES; ROOM TEMPERATURES; SCHOTTKY; SCHOTTKY BARRIERS; SIC WHISKERS; SILICON CARBIDE WHISKERS; SPECIFIC CAPACITANCES; SPECIFIC CONTACT RESISTANCES;

ATOMIC SPECTROSCOPY; CAPACITANCE; CARRIER CONCENTRATION; CESIUM; CONDUCTIVE MATERIALS; CRYSTAL WHISKERS; ELECTRIC CONTACTS; ELECTRODES; PLATINUM; SCHOTTKY BARRIER DIODES; SILICON CARBIDE; SILVER;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 65249102132     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3086279     Document Type: Article

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