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Volumn 95, Issue 3, 1996, Pages 125-128
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Characterisation of interfacial bonding in Al2O3 coated SiC whisker reinforced TZP composites
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Author keywords
[No Author keywords available]
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Indexed keywords
CERAMIC MATRIX COMPOSITES;
CHEMICAL BONDS;
CRYSTAL LATTICES;
DISLOCATIONS (CRYSTALS);
INTERDIFFUSION (SOLIDS);
POLYCRYSTALS;
SILICON CARBIDE;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY PHOTOELECTRON SPECTROSCOPY;
X RAY SPECTROSCOPY;
ZIRCONIA;
ALUMINUM OXIDE;
CHEMICAL BONDING;
INTERFACIAL BONDING;
TETRAGONAL ZIRCONIA POLYCRYSTAL;
WHISKER REINFORCED COMPOSITES;
X RAY SPECTROSCOPY ANALYSIS;
INTERFACES (MATERIALS);
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EID: 0029694741
PISSN: 09679782
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (11)
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