The influence of the prefiring temperature on the structure and surface morphology of sol-gel derived ZnO film

Materials Science- Poland

Volumn 27, Issue 1, 2009, Pages 159-170

  Hwang, K S ^a   Hwangbo, S ^b   Kim, J T ^c  

^a Nambu University   (South Korea)

^b Honam University   (South Korea)

^c Chosun University   (South Korea)

Author keywords

Sol gel method; Zinc naphthenate; ZnO thin film

Indexed keywords

AS-DEPOSITED FILMS; FIELD EMISSION-SCANNING ELECTRON MICROSCOPIES; FUNDAMENTAL ABSORPTION EDGES; HIGH RESOLUTION X-RAY DIFFRACTIONS; HIGH TRANSMITTANCES; HIGHER TEMPERATURES; HOMOGENEOUS SURFACES; SILICA GLASS SUBSTRATES; SOL-GEL METHOD; ULTRAVIOLET SPECTROPHOTOMETRIES; VISIBLE RANGES; VISIBLE REGIONS; ZNO; ZNO FILMS; ZNO THIN FILM;

CRYSTAL STRUCTURE; FIELD EMISSION; GELATION; GELS; HIGH RESOLUTION ELECTRON MICROSCOPY; METALLIC FILMS; OPTICAL FILMS; SCANNING; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SEMICONDUCTING ZINC COMPOUNDS; SILICA; SOL-GEL PROCESS; SOL-GELS; SOLS; SURFACE ROUGHNESS; THIN FILM DEVICES; THIN FILMS; ZINC; ZINC OXIDE;

SURFACE MORPHOLOGY;

EID: 65249092482     PISSN: 01371339     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (17)

1. HWANG K.S., KANG B.A., JEON Y.S., AN J.H., KIM B.H., NISHIO K., TSUCHIYA T., Surf. Coat. Tech., 190 (2005), 331.
2. RYU H.W., PARK J.S., HONG K.J., HWANG K.S., KANG B.A., OH J.S., Surf. Coat. Tech., 173 (2003), 19.
3. HWANG K.S., YUN Y.H., KANG B.A., KIM S.B., JANG S.W., KIM C.K., OH J.S., J. Mater. Sci.: Mater. in Med., 14 (2003), 761.
4. HWANG K.S., LEE S.O., KANG B.A., YUN Y.H., SHIM Y.A., OH J.S., YANG S.H., J. Mater. Sci. Lett., 22 (2003), 307.
5. HWANG K.S., JEON Y.S., KIM S.B., KIM C.K., OH J.S., AN J.H., KIM B.H., J. Kor. Phys. Soc., 43, (2003), 754.
6. HWANG K.S., JEONG J.H., JEON Y.S., JEON K.O., KIM B.H., J. Sol-Gel Sci. Tech., 35 (2005), 237.
7. KIM B.H., AN J.H., KANG B.A., HWANG K.S., OH J.S., J. Ceram. Proc. Res., 5, (2004), 53.
8. HWANG K.S., MIN S.S., PARK Y.J., Surf. Coat. Tech., 137 (2001), 205.
9. HWANG K.S., PhD., Tokyo Univ. of Sci. (2003),.
10. OHYAMA M., KOZUKA H., YOKO T., Thin Solid Films, 306 (1997), 78.
11. KIM B.H., AN J.H., JEON Y.S., JEONG J.T., KANG B.A., HWANG K.S., J. Mater. Sci. Lett., 40 (2005), 237.
12. LAN W., PENG X., LIU X., HE Z., WANG Y., Front. Mater. Sci. China 1 (2007), 88.
13. SHON S.Y., KIM H.M., PARK S.H., KIM J.J., J. Kor. Phys. Soc., 44 (2004), 1215.
14. CEBULLA R., WENDT R., ELLMER K., J. Appl. Phys., 83 (1998), 1087.
15. HSIEH P.T., CHEN Y.C., KAO K.S., LEE M.S., CHENG C.C., J. Euro. Ceram. Soc., 27 (2007), 3815.
16. KHANDELWAL R., SINGH A.P., KAPOOR A., GRIGORESCU S., MIGLIETTA P., STANKOVA N.E., PERRONE A., Optics Laser Tech., 40 (2008), 247.
17. SHIMONO D., TANAKA S., TOTIKAI T., WATARI T., MURANO M., J. Ceram. Proc. Res., 2 (2001), 184.