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Volumn 190, Issue 2-3, 2005, Pages 331-335
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AFM study of LaNiO3 thin films on various single crystal substrates prepared by using a metal naphthenate precursor
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Author keywords
Atomic force microscope; LaNiO3 thin film; Power spectral density
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
DEPOSITION;
LANTHANUM COMPOUNDS;
MAGNESIA;
MORPHOLOGY;
NAPHTHALENE;
SAPPHIRE;
SINGLE CRYSTALS;
SOLUTIONS;
GRAINS;
PRECURSORS;
ROOT MEAN SQUARE (RMS) ROUGHNESS;
SPATIAL FREQUENCIES;
THIN FILMS;
COATING;
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EID: 10144220003
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2004.03.005 Document Type: Article |
Times cited : (20)
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References (10)
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