메뉴 건너뛰기




Volumn 190, Issue 2-3, 2005, Pages 331-335

AFM study of LaNiO3 thin films on various single crystal substrates prepared by using a metal naphthenate precursor

Author keywords

Atomic force microscope; LaNiO3 thin film; Power spectral density

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; LANTHANUM COMPOUNDS; MAGNESIA; MORPHOLOGY; NAPHTHALENE; SAPPHIRE; SINGLE CRYSTALS; SOLUTIONS;

EID: 10144220003     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2004.03.005     Document Type: Article
Times cited : (20)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.