Properties of single crystal Fe1-x Gax thin films

Journal of Applied Physics

Volumn 105, Issue 7, 2009, Pages

  McClure, Adam ^a   Albert, S ^a,b   Jaeger, T ^a,b   Li, H ^a   Rugheimer, P ^a   Schaefer, J A ^b   Idzerda, Y U ^a  

^a MONTANA STATE UNIVERSITY   (United States)

^b ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL QUALITIES; DEPOSITED LAYERS; FMR LINEWIDTHS; GAAS SUBSTRATES; GAAS SURFACES; IN-SITU; SINGLE CRYSTAL THIN FILMS; VIBRATING-SAMPLE MAGNETOMETRIES;

CRYSTAL GROWTH; FERROMAGNETIC RESONANCE; GALLIUM ALLOYS; HIGH ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; MOLECULAR BEAMS; MOLECULAR DYNAMICS; SEMICONDUCTING GALLIUM; THIN FILMS;

SINGLE CRYSTALS;

EID: 65249086701     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3077207     Document Type: Article

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