Minimising warranty cost by design for reliability in product development phase

International Journal of Six Sigma and Competitive Advantage

Volumn 5, Issue 1, 2009, Pages 42-58

  Jin, Tongdan ^a   Ozalp, Yeliz ^b  

^a TEXAS A AND M INTERNATIONAL UNIVERSITY   (United States)

^b TERADYNE INC   (United States)

Author keywords

Design for reliability; Genetic algorithm; Reliability prediction; Warranty cost

Indexed keywords

EID: 64949198412     PISSN: 14792494     EISSN: 14792753     Source Type: Journal    
DOI: 10.1504/IJSSCA.2009.024214     Document Type: Article

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