A comprehensive methodology for complex field programmable gate array single event effects test and evaluation

IEEE Transactions on Nuclear Science

Volumn 56, Issue 2, 2009, Pages 366-374

  Berg, Melanie D ^a   LaBel, Kenneth A ^a   Kim, Hak ^a,b   Friendlich, Mark ^a,b   Phan, Anthony ^a,b   Perez, Christopher ^a,b  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b MEI Technologies   (United States)

Author keywords

Evaluation; FPGA; Scrubbing; Triple Mode Redundancy (TMR)

Indexed keywords

EVALUATION; FPGA; OPTIMAL DEVICES; SCRUBBING; SINGLE EVENT EFFECTS; SPACE MISSIONS; TEST AND EVALUATIONS; TRIPLE MODE REDUNDANCY (TMR);

QUALITY ASSURANCE; REDUNDANCY;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA);

EID: 64749091920     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2009.2013857     Document Type: Article

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