Single event effects (SEE) response of embedded power pes in a Xilinx Virtex-4 FPGA for a space application

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2007, Pages

  Poivey, Christian ^a   Berg, Melanie ^a   Friendlich, Mark ^a   Kim, Hak ^a   Petrick, Dave ^a   Stansberry, Scott ^b   LaBel, Kenneth A ^a   Seidleck, Christina ^a   Phan, Anthony ^a   Irwin, Tim ^a  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HUBBLE SPACE TELESCOPES; SERVICING MISSIONS; SINGLE EVENT EFFECTS;

FIELD PROGRAMMABLE GATE ARRAYS (FPGA); SECONDARY EMISSION; SPACE APPLICATIONS; SPACECRAFT OBSERVATORIES;

RADIATION EFFECTS;

EID: 70449587176     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2007.5205563     Document Type: Conference Paper

References (7)

1. J.Benedetto.P. Eaton, and R. Davies, "An examination of Single Event Functional Interrupts (SEFIs) in COTS SDRAMs," presented at 2006 SEE Symposium, Long-Beach, CA, Apr. 2006.
2. M. Berg, J-J. Wang, R. Ladbury, S. Buchner, H. Kim, J. Howard, K. LaBel, A. Phan, T. Irwin, and M. Friendlich, "An Analysis of Single Event Upset Dependencies on High Frequency and Architectural Implementations within Actel RTAX-S Family Field Programmable Gate Arrays," IEEE Trans. Nucl. Sci., vol. 53, n° 6, Dec. 2006.
3. G. Allen, G. Swift, C. Carmichael, C. Tseng, and G. Miller, "Initial Upset Measurements on a Virtex-4 FPGA Incorporating 90 nm Features and Thin Epitaxial Layer," Presented at SEE Symposium 2007, Long Beach, CA, Apr. 2007.
4. J. George, R. Koga, G. Swift, G. Allen, C. Carmichael, and C. W. Tseng, "Single Event Upsets in Xilinx Virtex-4 FPGA Devices," IEEE NSREC 2006 Data Workshop record, pp. 109-114.
5. J.W. Howard, H. Kim, M. Berg, K.A. LaBel, S. Stansberry, M. Friendlich, and T. Irwin, "Development of a Low-Cost and High-Speed Single Event Effects Testers based on Reconfigurable Field Programmable Gate Arrays (FPGA)," Presented at SEE Symposium 2006, Long Beach, CA, Apr. 2006.
6. H. Quinn, K. Morgan, P. Graham, J. Krone, and M. Caffrey, "Eight years of MBU Data: What Does it all Mean?," Presented at SEE Symposium 2007, Long Beach, CA, Apr. 2007.
7. A. Lesea and K. Castellani-Coulie, "Experimental Approach of Soft Error Effects in 90 nm Xilinx FPGA and Beyond," to be presented at RADECS 2007, Deauville, Sept. 2007.