Design of a hinge kit system in a Kimchi refrigerator receiving repetitive stresses

Engineering Failure Analysis

Volumn 16, Issue 5, 2009, Pages 1655-1665

  Woo, Seong woo ^a   O'Neal, Dennis L ^b   Pecht, Michael ^c  

^a SAMSUNG Electronics   (South Korea)

^b TEXAS A AND M UNIVERSITY   (United States)

^c CITY UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Accelerated life testing; Load analysis; Parameter design; Robustness

Indexed keywords

ACCELERATED LIFE TESTING; ACCELERATED LIFE TESTS; CORNER ROUNDING; CORRECTIVE ACTIONS; DESIGN PARAMETERS; DESIGN PHASE; FAILURE MODES AND MECHANISMS; FAILURE RATES; FIELD DATUM; KEY CONTROLS; LOAD ANALYSIS; MECHANICAL LOADS; MOMENT BALANCES; OIL DAMPERS; PARAMETER DESIGN; ROBUSTNESS;

CONTROL SYSTEM ANALYSIS; DESIGN; DOORS; HOUSING; LOAD TESTING; QUALITY ASSURANCE; REFRIGERATORS; RELIABILITY ANALYSIS; SAFETY FACTOR; SEALING (CLOSING); TESTING;

FAILURE ANALYSIS;

EID: 64649103546     PISSN: 13506307     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.engfailanal.2008.11.010     Document Type: Article

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