Failure analysis and redesign of a helix upper dispenser

Engineering Failure Analysis

Volumn 15, Issue 6, 2008, Pages 642-653

  Woo, Seong woo ^a   Pecht, Michael ^b  

^a SAMSUNG Electronics   (South Korea)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Accelerated life testing; Load analysis; Reliability design

Indexed keywords

FAILURE ANALYSIS; FRACTURE; RELIABILITY; SERVICE LIFE;

ACCELERATED LIFE TESTING; HELIX UPPER DISPENSER; LOAD ANALYSIS; RELIABILITY DESIGN;

REFRIGERATORS;

FAILURE ANALYSIS; FRACTURE; REFRIGERATORS; RELIABILITY; SERVICE LIFE;

EID: 40849116366     PISSN: 13506307     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.engfailanal.2007.10.005     Document Type: Article

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