Novel concepts for reliability technology

Microelectronics Reliability

Volumn 45, Issue 3-4, 2005, Pages 611-622

  Ryu, Dongsu ^a   Chang, Seogweon ^b  

^a SAMSUNG Electronics   (South Korea)

^b Hanyang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CUSTOMER SATISFACTION; DURABILITY; FAILURE ANALYSIS; PRODUCT DESIGN; QUALITY ASSURANCE; SALES;

BATHTUB CURVE; FAILURE MECHANICS; MEAN TIME TO FAILURE (MTTF); RELIABILITY TECHNOLOGY;

RELIABILITY;

EID: 15744406016     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.microrel.2004.10.010     Document Type: Article

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