Developing repeatable measurements for reliable analysis of molecules at surfaces using desorption electrospray ionization

Analytical Chemistry

Volumn 81, Issue 6, 2009, Pages 2286-2293

  Green, F M ^a   Stokes, P ^b   Hopley, C ^b   Seah, M P ^a   Gilmore, I S ^a   O'Connor, G ^b  

^a NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^b LGC   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABSOLUTE INTENSITIES; AMBIENT PRESSURES; BASIC PARAMETERS; CONTROLLED THICKNESS; DESORPTION ELECTROSPRAY IONIZATIONS; DESORPTION MECHANISMS; DROPLET DISTRIBUTIONS; ELECTROSPRAY; EROSION RATES; HIGH SENSITIVITIES; MATERIAL UTILIZATIONS; OPTIMAL SENSITIVITIES; RATE OF CONSUMPTION; RHODAMINE B; SECONDARY IONS; SPATIAL RESOLUTIONS; SPOT SIZES; SPUTTERING YIELDS; SURFACE EROSIONS; SYSTEMATIC STUDIES; UNIFORM FILMS;

CONFOCAL MICROSCOPY; DESORPTION; ELECTROSPRAY IONIZATION; EROSION; HIGH PERFORMANCE LIQUID CHROMATOGRAPHY; IONIZATION; MASS SPECTROMETERS; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SPECTRUM ANALYSIS; SPUTTERING;

SURFACES;

RHODAMINE B;

ANALYTIC METHOD; ARTICLE; CONFOCAL MICROSCOPY; DESORPTION; DESORPTION ELECTROSPRAY IONIZATION; GEOMETRY; IONIZATION; MASS SPECTROMETRY; SENSITIVITY ANALYSIS;

EID: 64649091709     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac802440w     Document Type: Article

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