|
Volumn 386-388, Issue C, 2009, Pages 169-172
|
Positron annihilation of vacancy-type defects in neutron-irradiated 4H-SiC
|
Author keywords
[No Author keywords available]
|
Indexed keywords
ANNEALING BEHAVIORS;
ANTI-SITE DEFECTS;
CARBON VACANCIES;
DEFECT RECOVERIES;
INTERSTITIALS;
ISOCHRONAL ANNEALING;
RANGE MIGRATIONS;
RECOVERY STAGES;
SILICON CLUSTERS;
TEMPERATURE RANGES;
VACANCY COMPLEXES;
VACANCY-TYPE DEFECTS;
ANNEALING;
CARBON CLUSTERS;
DEFECTS;
POSITRON ANNIHILATION;
POSITRON ANNIHILATION SPECTROSCOPY;
SILICON CARBIDE;
WEAR RESISTANCE;
VACANCIES;
|
EID: 64649085670
PISSN: 00223115
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jnucmat.2008.12.326 Document Type: Article |
Times cited : (17)
|
References (23)
|