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Volumn , Issue , 2008, Pages

Amorphous silicon thin-film transistors with DC saturation current half-life of more than 100 years

Author keywords

[No Author keywords available]

Indexed keywords

A-SI TFT; ACTIVE-MATRIX OLED; AMORPHOUS SILICON THIN FILM TRANSISTORS; DC SATURATION CURRENTS; HIGH QUALITIES; PHOSPHORESCENT OLED;

EID: 64549132891     PISSN: 01631918     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IEDM.2008.4796621     Document Type: Conference Paper
Times cited : (10)

References (10)
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  • 2
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  • 3
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    • Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs
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    • K. S. Karim, A. Nathan, M. Hack and W. I. Milne, "Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs", IEEE Elect. Dev. Lett. Vol. 25, no. 4, Apr. 2004, p. 188-190
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  • 4
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  • 5
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    • Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic
    • Jan
    • B. Hekmatshoar, A. Z. Kattamis, K. H. Cherenack, K. Long, J-Z. Chen, S. Wagner, J. C. Sturm, K. Rajan and M. Hack, "Reliability of Active-Matrix Organic Light-Emitting-Diode Arrays With Amorphous Silicon Thin-Film Transistor Backplanes on Clear Plastic", IEEE Elect. Dev. Lett., vol. 29, Jan. 2008, pp. 63-66
    • (2008) IEEE Elect. Dev. Lett , vol.29 , pp. 63-66
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.