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International Journal of Materials Research

Volumn 97, Issue 6, 2006, Pages 794-801

Microstructure and dielectric properties of nanoscale oxide layers on sintered capacitor-grade niobium and V-doped niobium powder compacts

(4) Stormer H a Ivers Tiffee E a Schnitter, C b Gerthsen, D a

a UNIVERSITY OF KARLSRUHE (Germany)

b H C Starck GmbH (Germany)

Author keywords

Microstructure; Nanoscale oxide; Niobium capacitor; SEM; TEM

Indexed keywords

ANODIC OXIDATION; CAPACITORS; DIELECTRIC PROPERTIES; ELECTROLYSIS; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; OXIDES; POWDER METALS; SEMICONDUCTOR DOPING; SINTERING; TRANSMISSION ELECTRON MICROSCOPY; VANADIUM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTECHNOLOGY; NIOBIUM OXIDE; POWDERS; SOLID ELECTROLYTES;

AMORPHOUS NIOBIUM OXIDE LAYERS; NANOSCALE OXIDES; NIOBIUM CAPACITORS; NIOBIUM POWDER COMPACTS;

NIOBIUM; SCANNING ELECTRON MICROSCOPY;

DIELECTRICS PROPERTY; ELECTROLYTICS; MICROSTRUCTURES PROPERTIES; NANOSCALE OXIDES; NIOBIUM CAPACITORS; NIOBIUM POWDER; OXIDE LAYER; POWDER COMPACTS; PROCESSING PARAMETERS; TEM;

EID: 33745615150 PISSN: 18625282 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (4)

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