Extended range NbO capacitors through technology and materials enhancements

CARTS Europe 2005

Volumn , Issue , 2005, Pages 57-63

  Zednicek S ^a   Horacek I ^a   Zednicek T ^a   Sita, Z ^a   McCracken, Colin ^b   Millman, William ^b  

^a AVX Czech Republic   (Czech Republic)

^b AVX Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE VOLTAGE; EXTENDED RANGE; LEAD FREE SOLDERS; MATERIALS AND PROCESS; PERFORMANCE AND RELIABILITIES; TANTALUM CAPACITORS; TECHNOLOGY ENHANCEMENTS;

CAPACITANCE; NIOBIUM OXIDE; TANTALUM;

CAPACITORS;

EID: 64449083809     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Horacek I et al., AVX "Lowest ESR at High Voltage - Multianode Tantalum Capacitors", CARTS EUROPE 2004, CTI, Nice, October 2004
2. Gill, J, AVX, "Surge in Solid Tantalum Capacitors", AVX Technical Information Paper, www.avxcorp.com
3. Sikula, J, et al., CNRL Brno University of Technology, "Conductivity Mechanisms And Breakdown Characteristics Of Niobium Oxide Capacitors", CARTS EUROPE 2003, CTI, Stuttgart, October 2003
4. S. Zednicek, Z. Sita et al.,AVX"Low ESR and Low Profile Technology on Niobium Oxide" CARTS USA 2004, CTI, San Antonio, April 2004