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Volumn 79, Issue 8, 2004, Pages 1919-1923
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Optical characterization of porous silicon films and multilayer filters
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Author keywords
[No Author keywords available]
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Indexed keywords
ABSORPTION;
ALGORITHMS;
CHARACTERIZATION;
ELECTROLYTES;
ETHANOL;
LIGHT INTERFERENCE;
MULTILAYERS;
OPTICAL PROPERTIES;
POROUS SILICON;
REFRACTIVE INDEX;
SILICON ON INSULATOR TECHNOLOGY;
SILICON WAFERS;
ABSORPTION LOSSES;
FORMATION-CURRENT DENSITIES;
MULTILAYER FILTERS;
PAREMETER-FITTING PROBLEMS;
THIN FILMS;
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EID: 6444235057
PISSN: 09478396
EISSN: None
Source Type: Journal
DOI: 10.1007/s00339-004-2642-x Document Type: Article |
Times cited : (46)
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References (22)
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