Preferred orientation of n -hexane crystallized in silicon nanochannels: A combined x-ray diffraction and sorption isotherm study

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 79, Issue 3, 2009, Pages

  Henschel, Anke ^a   Kumar, Pushpendra ^a   Hofmann, Tommy ^a   Knorr, Klaus ^a   Huber, Patrick ^a  

^a SAARLAND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BRIDGMAN; BULK CRYSTALLINE; CHANNEL AXIS; CRYSTALLINE TEXTURES; CRYSTALLIZATION PROCESS; CRYSTALLOGRAPHIC DIRECTIONS; FILLING FRACTIONS; GROWTH PROCESS; LONG AXIS; N HEXANES; NANO-CHANNELS; PREFERRED ORIENTATIONS; SILICON CHANNELS; SOLIDIFICATION FRONTS; SORPTION ISOTHERMS; SPATIAL CONFINEMENTS; TRICLINIC PHASE; X- RAY DIFFRACTIONS; X-RAY DIFFRACTION STUDIES;

CRYSTALLINE MATERIALS; CRYSTALLIZATION; DIFFRACTION; NANOFLUIDICS; SORPTION; TEXTURES; X RAY DIFFRACTION;

HEXANE;

EID: 64049119531     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.79.032601     Document Type: Article

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