Structure and properties of epitaxial thin films of Bi 2FeCrO6: A multiferroic material postulated by ab-initio computation

Integrated Ferroelectrics

Volumn 101, Issue 1, 2008, Pages 152-163

  Nechache, R ^a   Harnagea, C ^a   Carignan, L P ^b   Menard D ^b   Pignolet, A ^a  

^a INRS EMT   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Epitaxial thin film; Ferroelectricity; Magnetism; Multiferroics; Piezoresponse

Indexed keywords

AB INITIO; CATIONIC STOICHIOMETRY; CRYSTALLINE QUALITY; DEGREE OF CRYSTALLINITY; EPITAXIAL THIN FILM; EPITAXIAL THIN FILMS; FERROELECTRIC DOMAINS; FIRST-PRINCIPLES DENSITY FUNCTIONAL THEORY; MAGNETIC MEASUREMENTS; MULTIFERROIC MATERIALS; MULTIFERROICS; PIEZOELECTRIC MEASUREMENTS; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; ROOM TEMPERATURE; SELECTED AREA ELECTRON DIFFRACTION; SRTIO3 SUBSTRATES; STRUCTURE AND PROPERTIES; SUBMICRON SCALE; X-RAY MICROANALYSIS;

ABLATION; CHROMIUM; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DENSITY FUNCTIONAL THEORY; FERROELECTRIC FILMS; FERROELECTRICITY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LITHIUM COMPOUNDS; MAGNETIC MOMENTS; MICROANALYSIS; PIEZOELECTRIC DEVICES; PIEZOELECTRICITY; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

EPITAXIAL FILMS;

EID: 63749114291     PISSN: 10584587     EISSN: 16078489     Source Type: Journal    
DOI: 10.1080/10584580802470900     Document Type: Conference Paper

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