Crystal structure and electrical property comparisons of epitaxial Pb(Zr,Ti)O3 thick films grown on (100) CaF2 and (100) SrTiO3 substrates

Journal of Applied Physics

Volumn 105, Issue 6, 2009, Pages

  Fujisawa, Takashi ^a   Nakaki, Hiroshi ^a   Ikariyama, Rikyu ^a   Yamada, Tomoaki ^a   Ishikawa, Mutsuo ^a   Morioka, Hitoshi ^a,b   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b BRUKER AXS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATED VALUES; COERCIVE FIELDS; DEPOSITION TEMPERATURES; ELECTRIC-FIELD; ELECTRICAL PROPERTIES; EPITAXIAL THICK FILMS; LARGE STRAINS; LATTICE PARAMETERS; LINEAR RELATIONSHIPS; METAL-ORGANIC CHEMICAL VAPOR DEPOSITIONS; ORIENTED FILMS; PB(ZR ,TI)O; PZT; PZT THICK FILMS; RELATIVE DIELECTRIC CONSTANTS; SATURATED POLARIZATIONS; SATURATION POLARIZATIONS; SQUARE SHAPES; TETRAGONAL SYMMETRIES; THEORETICAL PREDICTIONS; THERMAL STRAINS;

CRYSTAL STRUCTURE; ELECTRIC PROPERTIES; HYSTERESIS; HYSTERESIS LOOPS; LEAD; LEAD ALLOYS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; ORGANIC CHEMICALS; ORGANOMETALLICS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; POLARIZATION; SEMICONDUCTING LEAD COMPOUNDS; SINGLE CRYSTALS; STRONTIUM ALLOYS; SUBSTRATES; THICK FILMS; ZIRCONIUM;

EPITAXIAL FILMS;

EID: 63749112751     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3073823     Document Type: Article

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