Thick epitaxial Pb(Zr0.35,Ti0.65)O3 films grown on (100)CaF2 substrates with polar-axis-orientation

Applied Physics Express

Volumn 1, Issue 8, 2008, Pages 0850011-0850013

  Fujisawa, Takashi ^a   Nakaki, Hiroshi ^a   Ikariyama, Rikyu ^a   Morioka, Hitoshi ^a,b   Yamada, Tomoaki ^a   Saito, Keisuke ^b   Funakubo, Hiroshi ^a  

^a TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

^b BRUKER AXS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CLARIFICATION; CRYSTALLOGRAPHY; LEAD; LEAD ALLOYS; ORGANIC CHEMICALS; ORGANIC COMPOUNDS; ORGANOMETALLICS; PIEZOELECTRIC ACTUATORS; PIEZOELECTRIC MATERIALS; PIEZOELECTRIC TRANSDUCERS; SEMICONDUCTING LEAD COMPOUNDS; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SUBSTRATES; THICK FILMS; ZIRCONIUM;

COOLING PROCESSES; DEPOSITION TEMPERATURES; EPITAXIALLY GROWN; METAL ORGANIC; NOVEL APPLICATIONS; PZT THICK FILMS; REMANENT POLARIZATIONS; THERMAL STRAINS; THICK EPITAXIAL;

EPITAXIAL FILMS;

EID: 57649086464     PISSN: 18820778     EISSN: 18820786     Source Type: Journal    
DOI: 10.1143/APEX.1.085001     Document Type: Article

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