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Review of Scientific Instruments

Volumn 80, Issue 3, 2009, Pages

Improved double planar probe data analysis technique

(2) Ghim, Young Chul a Hershkowitz, Noah a

a University of Wisconsin Madison (United States)

Author keywords

[No Author keywords available]

Indexed keywords

PLASMAS;

AR PLASMAS; DATA ANALYSIS TECHNIQUES; DENSITY MEASUREMENTS; DOUBLE PROBES; EMPIRICAL FORMULAS; NUMBER DENSITIES; PLANAR LANGMUIR PROBES; PLASMA ELECTRONS; SHEATH EXPANSIONS;

PROBES;

EID: 63649134823 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.3089811 Document Type: Article

Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.