Subsolidus phase relations in the system ZnO-B2O3-V2O5

Journal of Alloys and Compounds

Volumn 475, Issue 1-2, 2009, Pages 122-125

  Zhan, Zhibing ^a   Chen, Dagui ^a   Lv, Peiwen ^a   Liu, Demin ^a   Yan, Fengbo ^a   Chen, Xianzhi ^a   Huang, Feng ^a  

^a FUJIAN INSTITUTE OF RESEARCH ON THE STRUCTURE OF MATTER   (China)

Author keywords

Phase diagrams; X ray diffraction; Zn4V2O9 Zn3B2O6; ZnO semiconductor; ZnO B2O3 V2O5 system

Indexed keywords

DIFFRACTION; ELECTRIC CONDUCTIVITY; EUTECTICS; GRAIN BOUNDARIES; PHASE DIAGRAMS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; TERNARY ALLOYS; TERNARY SYSTEMS; THERMOANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC;

BINARY COMPOUNDS; DIFFERENTIAL-THERMAL ANALYSIS; EUTECTIC POINTS; EUTECTIC SYSTEMS; EUTECTIC TEMPERATURES; PHASE REGIONS; PSEUDO-BINARY SYSTEMS; SUBSOLIDUS PHASE RELATIONS; TERNARY COMPOUNDS; XRD; ZN4V2O9-ZN3B2O6; ZNO SEMICONDUCTOR; ZNO-B2O3-V2O5 SYSTEM;

ZINC OXIDE;

EID: 63649109930     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2008.08.027     Document Type: Article

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