Return via connections for extending signal link path bandwidth of via transitions

IEEE International Symposium on Electromagnetic Compatibility

Volumn , Issue , 2008, Pages

  Chang, Xin ^a   Archambeault, Bruce ^b   Cocchini, Matteo ^a   De Paulis, Francesco ^a   Sivarajan, Vysakh ^a   Zhang, Yaojiang ^a   Fan, Jun ^a   Connor, Samuel ^b   Orlandi, Antonio ^c   Drewniak, Jim ^a  

^a MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

^b IBM   (United States)

^c UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Cavity resonance; EMI; Signal integrity; Via

Indexed keywords

EQUIVALENT CIRCUITS;

CAVITY EFFECT; CAVITY RESONANCES; REFERENCE PLANE; RETURN CURRENT; SIGNAL INTEGRITY;

ELECTROMAGNETIC COMPATIBILITY;

EID: 63549119657     PISSN: 10774076     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/EMCEUROPE.2008.4786874     Document Type: Conference Paper

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