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Volumn B, Issue , 2003, Pages 1021-1024

Analysis of very thin high-efficiency solar cells

Author keywords

[No Author keywords available]

Indexed keywords

CELL THICKNESS; LASER FIRED CONTACTS (LFC) METHOD; MECHANICAL ABRASION; REAR CELLS;

EID: 6344289182     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (9)

References (11)
  • 8
    • 0000513411 scopus 로고    scopus 로고
    • Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi- Steady-state photoconductance data
    • R. A. Sinton and A. Cuevas, "Contactless determination of current-voltage characteristics and minority-carrier lifetimes in semiconductors from quasi- steady-state photoconductance data", Appl. Phys. Lett. 69, 2510-2 (1996)
    • (1996) Appl. Phys. Lett. , vol.69 , pp. 2510-2512
    • Sinton, R.A.1    Cuevas, A.2
  • 9
    • 0034268273 scopus 로고    scopus 로고
    • Highly efficient 115-μm-thick solar cells on industrial Czochralski silicon
    • W. Warta, S. W. Glunz, J. Dicker, and J. Knobloch, "Highly efficient 115-μm-thick solar cells on industrial Czochralski silicon", Progr. Photovolt. 8, 465-71 (2000)
    • (2000) Progr. Photovolt. , vol.8 , pp. 465-471
    • Warta, W.1    Glunz, S.W.2    Dicker, J.3    Knobloch, J.4
  • 10
    • 0037450271 scopus 로고    scopus 로고
    • Electronic properties of the metastable defect in boron-doped Czochralski silicon: Unambiguous determination by advanced lifetime spectroscopy
    • S. Rein and S. W. Glunz, "Electronic properties of the metastable defect in boron-doped Czochralski silicon: Unambiguous determination by advanced lifetime spectroscopy", Appl. Phys. Lett. 82, 1054-56 (2003)
    • (2003) Appl. Phys. Lett. , vol.82 , pp. 1054-1056
    • Rein, S.1    Glunz, S.W.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.