Fullband particle-based simulation of high-field transient transport in III-V semiconductors

2002 International Conference on Modeling and Simulation of Microsystems - MSM 2002

Volumn , Issue , 2002, Pages 564-567

  Wigger, S ^a   Saraniti, M ^b   Goodnick, S ^a   Leitenstorfer, A ^c  

^a Arizona State University   (United States)

^b Illinois Institute of Technology   (United States)

^c TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

High field transport; Monte Carlo simulation; Tera hertz radiation

Indexed keywords

ABSORPTION; COMPUTER SIMULATION; ELECTRIC FIELDS; FUNCTIONS; IMPACT IONIZATION; INTEGRATION; MONTE CARLO METHODS; RADIATION; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTING INDIUM PHOSPHIDE; SEMICONDUCTOR DIODES;

ELECTRON-HOLE PAIRS; HIGH-FIELD TRANSPORT; OPTICAL PHONONS; TERA-HERTZ RADIATION;

SEMICONDUCTOR DEVICES;

EID: 6344287935     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. A. Leitenstorfer, S. Hunsche, J. Shah, M.C. Nuss, and W.H. Knox. Femtosecond high-field transport in compound semiconductors. Physical Review B, 61(24):16642-16652, June 2000.
2. M. Saraniti and S.M. Goodnick. Hybrid full-band Cellular Automaton/Monte Carlo approach for fast simulation of semiconductor devices. IEEE Transactions on Electron Devices, 47(10):1909-1915, October 2000.
3. M.V Fischetti, N. Sano, S.E. Laux, and K. Natori. Full-band-structure theory of high-field transport and impact ionization of electrons and holes in Ge, Si, and GaAs. In Proceedings of the 1996 Intl. Conf. of Semiconductor Processes and Devices (SISPAD'96), Tokyo, Japan, 1996.
4. S.M. Goodnick and P. Lugli. Hot-carrier relaxation on quasi-2d systems. In Jagdeep Shah, editor, Hot Carriers in Semiconductor Nanostructures: Physics and Applications, volume 8, chapter III.1, pages 191-234. Academic Press, 1992.
5. V. Gruzinskis, S. Kersulis, and A. Reklaitis. An effiecient monte carlo particle technique for two-dimensional transistor modelling. Semiconductor Science and Technology, 6(7):602-606, July 1991.