Strain effect on the final state density-of-state for hole scattering in silicon

2003 Nanotechnology Conference and Trade Show - Nanotech 2003

Volumn 2, Issue , 2003, Pages 186-189

  Matsuda, K ^a   Nakatsuji, H ^b   Kamakura, Y ^b  

^a NARUTO UNIVERSITY OF EDUCATION   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Density of state; Final state; Hole scattering; Silicon; Strain

Indexed keywords

CHARGE CARRIERS; CHARGE TRANSFER; COMPUTER SIMULATION; ELECTRONIC DENSITY OF STATES; HOLE MOBILITY; MATHEMATICAL MODELS; PHONONS; STRAIN;

DENSITY OF STATES; FINAL STATES; HOLE SCATTERING; PHONON SCATTERING;

SEMICONDUCTING SILICON;

EID: 6344276904     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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