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Volumn , Issue , 2002, Pages 645-648
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Challenges of modeling VLSI interconnects in the DSM era
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Author keywords
Interconnect modeling; Interconnect parasitic extraction; Silicon validation of interconnect models
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Indexed keywords
BANDWIDTH;
BOUNDARY ELEMENT METHOD;
CAPACITANCE;
DIFFERENTIAL EQUATIONS;
EXTRACTION;
FINITE ELEMENT METHOD;
INTERCONNECTION NETWORKS;
MAXWELL EQUATIONS;
SILICON;
FREQUENCY BANDWIDTH;
INTERCONNECT MODELING;
INTERCONNECTS PARASITIC;
SILICON VALIDATION;
VLSI CIRCUITS;
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EID: 6344265792
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (8)
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References (15)
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