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Volumn , Issue , 2002, Pages 645-648

Challenges of modeling VLSI interconnects in the DSM era

Author keywords

Interconnect modeling; Interconnect parasitic extraction; Silicon validation of interconnect models

Indexed keywords

BANDWIDTH; BOUNDARY ELEMENT METHOD; CAPACITANCE; DIFFERENTIAL EQUATIONS; EXTRACTION; FINITE ELEMENT METHOD; INTERCONNECTION NETWORKS; MAXWELL EQUATIONS; SILICON;

EID: 6344265792     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (8)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.