Change of lattice distortion images in X-ray topography with resonant scattering in the Laue case

Journal of Synchrotron Radiation

Volumn 11, Issue 3, 2004, Pages 266-271

  Negishi, Riichirou ^a   Yoshizawa, Masami ^a   Zhou, Shengming ^a   Matsumoto, Isao ^b   Fukamachi, Tomoe ^a   Kawamura, Takaaki ^c  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

Dislocation contrast; GaAs; Lattice distortion; Resonant scattering; X ray topography

Indexed keywords

CRYSTAL LATTICES; DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE REFLECTION; IMAGE QUALITY; RESONANCE; SEMICONDUCTING GALLIUM ARSENIDE; SYNCHROTRON RADIATION; TUNING; X RAY SCATTERING;

DISLOCATION CONTRASTS; GAAS; LATTICE DISTORTION; RESONANT SCATTERING; X-RAY TOPOGRAPHY;

X RAY OPTICS;

EID: 6344261320     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049504001992     Document Type: Article

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