Effect of strong Borrmann absorption on X-ray fluorescence yield curves

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 37, Issue 7, 1998, Pages 4014-4015

  Negishi, Riichirou ^a   Fukamachi, Tomoe ^a   Xu, Zhangcheng ^b   Yoshizawa, Masami ^a   Matsumoto, Isao ^c   Kawamura, Takaaki ^d   Nakajima, Tetsuo ^e  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

^c GRADUATE UNIVERSITY FOR ADVANCED STUDIES   (Japan)

^d UNIVERSITY OF YAMANASHI   (Japan)

^e HIGH ENERGY ACCELERATOR RESEARCH ORGANIZATION KEK   (Japan)

Author keywords

Anomalous dispersion; Borrmann effect; Dynamical diffraction; Fluorescence X ray; GaAs

Indexed keywords

DIFFRACTION; ELECTROMAGNETIC DISPERSION; SEMICONDUCTING GALLIUM ARSENIDE; X RAYS;

BORRMANN EFFECT;

FLUORESCENCE;

EID: 0032117932     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.37.4014     Document Type: Article

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