Image contrast of lattice defects in X-ray topography by resonant scattering

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 40, Issue 8 B, 2001, Pages

  Negishi, Riichirou ^a   Yoshizawa, Masami ^a   Zhou, Shengming ^a   Matsumoto, Isao ^a   Fukamachi, Tomoe ^a   Kawamura, Takaaki ^b  

^a SAITAMA INSTITUTE OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

Borrmann effect; Dynamical diffraction; GaAs; Resonant scattering; X ray topography

Indexed keywords

CRYSTAL DEFECTS; ELECTROMAGNETIC WAVE POLARIZATION; MATHEMATICAL MODELS; SYNCHROTRONS; X RAY SCATTERING;

X-RAY TOPOGRAPHY;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0035880323     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.l884     Document Type: Article

References (12)