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Volumn 79, Issue 8, 2004, Pages 2055-2062

Interface mixing in Co/Cu: In situ electrical conductivity measurements on pulsed-laser-deposited multilayers

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRIC CONDUCTIVITY; MULTILAYERS; PULSED LASER DEPOSITION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAYS;

EID: 6344252683     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2710-2     Document Type: Article
Times cited : (3)

References (30)
  • 7
    • 6344232436 scopus 로고
    • ed. by D.B. Chrisey, G.H. Hubler (Wiley, New York)
    • S. Metev: Pulsed Laser Deposition of Thin Films ed. by D.B. Chrisey, G.H. Hubler (Wiley, New York 1994) p. 257
    • (1994) Pulsed Laser Deposition of Thin Films , pp. 257
    • Metev, S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.