Electronic scattering from Co/Cu interfaces: In situ measurement and comparison with theory

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 2, 2000, Pages 1330-1335

  Bailey, William E ^a   Wang, Shan X ^a  

^a Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001348259     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.1330     Document Type: Article

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