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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Nanoscale evaluation of surface roughness of metal films prepared by laser ablation

(4) Sumomogi, T a Sakai, H a Nakata, M a Endo, T a

a Hiroshima Kokusai Gakuin University (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; BULK METALS; GLASS SUBSTRATES; LASER ENERGY DENSITY; METAL FILM; NANO-METER SCALE; NANOSCALE EVALUATION; PEAK- VALLEY; PULSED ND:YAG LASER; REAL VALUES; SIMPLE MODEL; TIP RADIUS;

ABLATION; ATOMIC FORCE MICROSCOPY; GLASS LASERS; METAL ANALYSIS; METALLIC FILMS; PULSED LASER APPLICATIONS; PULSED LASERS; SURFACE PROPERTIES; SURFACE ROUGHNESS;

NEODYMIUM LASERS;

EID: 0742312254 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051248 Document Type: Article

Times cited : (4)

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