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Volumn B, Issue , 2003, Pages 1147-1150

Highly moisture-resistive SiNx films by catalytic chemical vapor deposition and their application to passivation and antireflection coating for crystalline Si solar cells

Author keywords

[No Author keywords available]

Indexed keywords

CRACKING REACTIONS; MOISTURE RESISTIVITY; NITRIDATION; PLASMA DAMAGE;

EID: 6344249000     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (10)
  • 1
    • 0035800988 scopus 로고    scopus 로고
    • Summary of research in NEDO cat-CVD project in Japan
    • H. Matsumura, "Summary of Research in NEDO Cat-CVD Project in Japan", Thin Solid Films 395, 1 (2001).
    • (2001) Thin Solid Films , vol.395 , pp. 1
    • Matsumura, H.1
  • 3
    • 0034849447 scopus 로고    scopus 로고
    • Formation of high moisture and dopant diffusion resistivity silicon nitride films by catalytic-CVD method
    • A. Izumi, H. Sato and H. Matsumura, "Formation of High Moisture and Dopant Diffusion Resistivity Silicon Nitride Films by Catalytic-CVD Method", J. Phys. IV France 11, Pr3-901 (2001).
    • (2001) J. Phys. IV France , vol.11 , Issue.PART 3-901
    • Izumi, A.1    Sato, H.2    Matsumura, H.3
  • 6
    • 0037809526 scopus 로고    scopus 로고
    • Electrical properties of silicon nitride films deposited by catalytic chemical vapor deposition on catalytically nitrided Si (100)
    • A. Kikkawa, R. Morimoto, A. Izumi and H. Matsumura, "Electrical Properties of Silicon Nitride Films Deposited by Catalytic Chemical Vapor Deposition on Catalytically Nitrided Si (100)", Thin Solid Films 430, 100(2003).
    • (2003) Thin Solid Films , vol.430 , pp. 100
    • Kikkawa, A.1    Morimoto, R.2    Izumi, A.3    Matsumura, H.4
  • 7
    • 36549096341 scopus 로고
    • Analysis of the interaction of a laser pulse with a silicon wafer: Determination of bulk lifetime and surface recombination velocity
    • K. L. Luke and L.-J. Cheng, "Analysis of the Interaction of a Laser Pulse with a Silicon Wafer: Determination of Bulk Lifetime and Surface Recombination Velocity", J. Appl. Phys. 61, 2282 (1987).
    • (1987) J. Appl. Phys. , vol.61 , pp. 2282
    • Luke, K.L.1    Cheng, L.-J.2
  • 8
    • 0030087214 scopus 로고    scopus 로고
    • On the data analysis of light-biased photoconductance decay measurements
    • A. G. Aberle, J. Schmidt and R. Brendel, "On the Data Analysis of Light-Biased Photoconductance Decay Measurements", J. Appl. Phys. 79, 1491 (1996).
    • (1996) J. Appl. Phys. , vol.79 , pp. 1491
    • Aberle, A.G.1    Schmidt, J.2    Brendel, R.3
  • 9
    • 0028461229 scopus 로고
    • Surface recombination velocity measurements at the silicon-silicon dioxide interface by microwave-detected photoconductance decay
    • A. W. Stephens, A. G. Aberle and M. A. Green, "Surface Recombination Velocity Measurements at the Silicon-Silicon Dioxide Interface by Microwave-Detected Photoconductance Decay", J. Appl. Phys. 76, 363 (1994).
    • (1994) J. Appl. Phys. , vol.76 , pp. 363
    • Stephens, A.W.1    Aberle, A.G.2    Green, M.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.