Optimization of c-Si films formed by zone-melting recrystallization for thin-film solar cells

Proceedings of the 3rd World Conference on Photovoltaic Energy Conversion

Volumn B, Issue , 2003, Pages 1170-1173

  Kieliba, Thomas ^a   Pohl, Johannes ^a   Eyer, Achim ^a   Schmiga, Christian ^b  

^a FRAUNHOFER INSTITUTE FOR SOLAR ENERGY SYSTEMS ISE   (Germany)

^b INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ETCH PIT DENSITY (EPD); FILM QUALITY; MODULATED FREE CARRIER ABSORPTION (MFCA); ZONE-MELTING RECRYSTALLIZATION (ZMR);

CHEMICAL VAPOR DEPOSITION; MELTING; MORPHOLOGY; PARAMETER ESTIMATION; RECRYSTALLIZATION (METALLURGY); SILICON WAFERS; SOLIDIFICATION; THIN FILMS;

SOLAR CELLS;

EID: 6344243287     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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