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Volumn 48, Issue 1-4, 1997, Pages 261-267
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Characterization of thin-film silicon formed by high-speed zone-melting recrystallization process
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Author keywords
High speed zone melting; Recrystallization; Thin film silicon
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Indexed keywords
CRYSTAL DEFECTS;
CRYSTAL STRUCTURE;
CRYSTALLIZATION;
MORPHOLOGY;
SOLIDIFICATION;
THIN FILMS;
CRYSTAL QUALITY;
DEFECT DENSITIES;
ZONE MELTING RECRYSTALLIZATION (ZMR);
SILICON SOLAR CELLS;
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EID: 0031271906
PISSN: 09270248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-0248(97)00109-8 Document Type: Article |
Times cited : (13)
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References (8)
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