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Volumn 48, Issue 1-4, 1997, Pages 261-267

Characterization of thin-film silicon formed by high-speed zone-melting recrystallization process

Author keywords

High speed zone melting; Recrystallization; Thin film silicon

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; CRYSTALLIZATION; MORPHOLOGY; SOLIDIFICATION; THIN FILMS;

EID: 0031271906     PISSN: 09270248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0927-0248(97)00109-8     Document Type: Article
Times cited : (13)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.