Charge injection/extraction at a metal-dielectric interface: Experimental validation - [Feature article]

IEEE Electrical Insulation Magazine

Volumn 25, Issue 1, 2009, Pages 15-22

  Neagu, Eugen R ^a,b   Dias, Carlos J ^b  

^a GHEORGHE ASACHI TECHNICAL UNIVERSITY OF IASI   (Romania)

^b DEPARTAMENTO DE CIÊNCIA DOS MATERIAIS   (Portugal)

Author keywords

Charge accumulation; Charge injection extraction; Conduction current; Metal dielectric interface; Polymeric insulation; Space charge

Indexed keywords

CHARGE TRANSFER; ELECTRIC SPACE CHARGE; ELECTRON AFFINITY; INTERFACES (MATERIALS); METALS; POLYMERS; SCHOTTKY BARRIER DIODES; SEMICONDUCTOR JUNCTIONS; SURFACE STATES;

CHARGE ACCUMULATION; CONDUCTION CURRENT; EXPERIMENTAL VALIDATIONS; METAL POLYMER INTERFACES; METAL SEMICONDUCTOR INTERFACE; METAL-DIELECTRIC INTERFACE; POLYMERIC INSULATION; SURFACE STATE DENSITY;

INTERFACE STATES;

EID: 63249129479     PISSN: 08837554     EISSN: None     Source Type: Journal    
DOI: 10.1109/MEI.2009.4795465     Document Type: Article

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