Space charge profile measurement techniques: Recent advances and future directions

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 12, Issue 5, 2005, Pages 967-978

  Fleming, R J ^a,b  

^a MONASH UNIVERSITY   (Australia)

^b Australian Institute of Physics   (Australia)

Author keywords

Conducting atomic force microscopy; Laser induced pressure pulse; Laser intensity modulation method; Pressure wave propagation; Pulsed electroacoustic; Space charge profiles; Spatial resolution

Indexed keywords

LASER INDUCED PRESSURE PULSE; PRESSURE WAVE PROPAGATION; PULSED ELECTROACOUSTICS; SPACE CHARGE PROFILES; SPATIAL RESOLUTION;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; DIELECTRIC MATERIALS; LASER PULSES; NANOSTRUCTURED MATERIALS; WAVE PROPAGATION;

ELECTRIC SPACE CHARGE;

EID: 28844505098     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2005.1522190     Document Type: Conference Paper

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