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Volumn 29, Issue 1, 2009, Pages 104-115

Mixed-signal approximate computation: A neural predictor case study

Author keywords

Accuracy; Analog circuits; Approximate computation; Computer architecture; Correlation; Data mining; History; Imprecise; Low power; Mixed signal; Neural predictor; Prediction algorithms; Probability density function; Programmable; Registers

Indexed keywords

ANALOG CIRCUITS; COMPUTER ARCHITECTURE; COMPUTER CIRCUITS; COMPUTERS; INFORMATION MANAGEMENT;

EID: 63149140167     PISSN: 02721732     EISSN: None     Source Type: Journal    
DOI: 10.1109/MM.2009.10     Document Type: Conference Paper
Times cited : (11)

References (8)
  • 1
    • 63149087760 scopus 로고    scopus 로고
    • A 256 Kbits L-Tage Branch Predictor
    • JILP, May
    • A. Seznec, "A 256 Kbits L-Tage Branch Predictor," J. Instruction-Level Parallelism (JILP), vol. 9, May 2007; http:// www.jilp.org/vol9/v9paper6.pdf.
    • (2007) J. Instruction-Level Parallelism , vol.9
    • Seznec, A.1
  • 2
    • 23944497343 scopus 로고    scopus 로고
    • Redundant History Skewed Perceptron Predictors: Pushing Limits on Global History Branch Predictors,
    • 1554, 2003
    • A. Seznec, "Redundant History Skewed Perceptron Predictors: Pushing Limits on Global History Branch Predictors," IRISA tech. report 1554, 2003.
    • IRISA tech. report
    • Seznec, A.1
  • 6
    • 34547664408 scopus 로고    scopus 로고
    • Cacti 4.0
    • HP Laboratories Palo Alto, tech. report HPL-2006-86
    • D. Tarjan, S. Thoziyoor, and N.P. Jouppi, "Cacti 4.0," HP Laboratories Palo Alto, tech. report HPL-2006-86, 2006.
    • (2006)
    • Tarjan, D.1    Thoziyoor, S.2    Jouppi, N.P.3
  • 7
    • 0026910792 scopus 로고
    • Built-in Selftest (BIST) Structures for Analog Circuit Fault Diagnosis with Current Test Data
    • Aug
    • S. Wey and C.-L. Krishman, "Built-in Selftest (BIST) Structures for Analog Circuit Fault Diagnosis with Current Test Data," IEEE Trans. Instrumentation and Measurement, vol. 41, no. 4, Aug. 1992, pp. 535-539.
    • (1992) IEEE Trans. Instrumentation and Measurement , vol.41 , Issue.4 , pp. 535-539
    • Wey, S.1    Krishman, C.-L.2
  • 8
    • 0030169450 scopus 로고    scopus 로고
    • Real-Time Current Testing for a/d Converters
    • Mar./Apr
    • Y. Miura, "Real-Time Current Testing for a/d Converters," IEEE Design & Test, vol. 13, no. 2, Mar./Apr. 1996, pp. 34-41.
    • (1996) IEEE Design & Test , vol.13 , Issue.2 , pp. 34-41
    • Miura, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.