Real-time current testing for A/D converters

IEEE Design and Test of Computers

Volumn 13, Issue 2, 1996, Pages 34-41

  Miura, Yukiya ^a,b,c,d  

^a TOKYO METROPOLITAN UNIVERSITY   (Japan)

^b AKITA UNIVERSITY   (Japan)

^c OSAKA UNIVERSITY   (Japan)

^d IEEE

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTRIC CURRENTS; INTEGRATED CIRCUIT TESTING; REAL TIME SYSTEMS;

CIRCUIT UNDER TEST (CUT); CURRENT TESTING METHODS; MIXED SIGNAL CIRCUITS;

ANALOG TO DIGITAL CONVERSION;

EID: 0030169450     PISSN: 07407475     EISSN: None     Source Type: Journal    
DOI: 10.1109/54.500199     Document Type: Article

References (12)

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