|
Volumn 517, Issue 11, 2009, Pages 3253-3256
|
Effect of growth temperature on the structural and transport properties of magnetite thin films prepared by pulse laser deposition on single crystal Si substrate
|
Author keywords
Electrical properties and measurements; Magnetite; Pulsed laser deposition; Spintronics; X ray diffraction; X ray photoelectron spectroscopy
|
Indexed keywords
DIFFRACTION;
ELECTRODEPOSITION;
ELECTRON SPECTROSCOPY;
FILM GROWTH;
FILM PREPARATION;
LASERS;
MAGNETITE;
NANOTECHNOLOGY;
ORGANIC LIGHT EMITTING DIODES (OLED);
OXIDE MINERALS;
PHOTOELECTRICITY;
PHOTOIONIZATION;
PHOTONS;
PULSED LASER DEPOSITION;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
SINGLE CRYSTALS;
SPECTRUM ANALYSIS;
SUBSTRATES;
THERMAL EFFECTS;
THIN FILMS;
TRANSPORT PROPERTIES;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
X RAYS;
CONDUCTION MECHANISMS;
DIFFERENT SUBSTRATES;
ELECTRICAL PROPERTIES AND MEASUREMENTS;
ELECTRICAL TRANSPORTS;
MAGNETITE THIN FILMS;
MIXED OXIDES;
POLY-CRYSTALLINE;
PULSE LASER DEPOSITIONS;
RAMAN MEASUREMENTS;
RESISTIVITY BEHAVIORS;
SILICON (111) SUBSTRATE;
SINGLE PHASE;
SINGLE-CRYSTAL SI;
SPINTRONICS;
SUBSTRATE TEMPERATURES;
VARIABLE RANGE HOPPING;
VERWEY TRANSITION TEMPERATURES;
X-RAY PHOTOELECTRON SPECTROSCOPY STUDIES;
XRD;
X RAY PHOTOELECTRON SPECTROSCOPY;
|
EID: 62849104836
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2008.11.074 Document Type: Article |
Times cited : (22)
|
References (20)
|