In situ xps analysis of various iron oxide films grown by (formula presented)-assisted molecular-beam epitaxy

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 4, 1999, Pages 3195-3202

  Fujii, T ^a,b   de Groot, F M F ^a   Sawatzky, G A ^a   Voogt, F C ^a   Hibma, T ^a   Okada, K ^b  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

^b OKAYAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001019412     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.3195     Document Type: Article

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