Fabrication and optical characterization of nanoporous alumina films annealed at different temperatures

Optical Materials

Volumn 31, Issue 6, 2009, Pages 860-864

  Marsal, L F ^a   Vojkuvka, L ^a   Formentin, P ^a   Pallares J ^a   Ferre Borrull J ^a  

^a UNIVERSITAT ROVIRA I VIRGILI   (Spain)

Author keywords

Nanoporous alumina; Self ordering process; Transmission spectra; X ray diffraction

Indexed keywords

ALUMINA; ALUMINUM OXIDE; ANNEALING; GAMMA RAYS; LIGHT TRANSMISSION; PORE SIZE; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EXTINCTION COEFFICIENT (K); NANOPOROUS ALUMINA; NANOPOROUS ANODIC ALUMINAS; OPTICAL CHARACTERIZATION; OPTICAL TRANSMISSION SPECTRUM; SELF-ORDERING PROCESS; STRUCTURAL AND OPTICAL PROPERTIES; TRANSMISSION SPECTRUMS;

OPTICAL FILMS;

EID: 62749196596     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2008.09.008     Document Type: Article

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