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Zeitschrift fur Kristallographie, Supplement

Volumn , Issue 27, 2008, Pages 151-158

Refining real structure parameters of disordered layer structures within the rietveld method

(5) Ufer, K a Kleeberg, R a Bergmann, J b Curtius, H c Dohrmann, R d

a TU BERGAKADEMIE FREIBERG (Germany)

b Institute of Energy Research ^* (Germany)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

d FEDERAL INSTITUTE FOR GEOSCIENCES AND NATURAL RESOURCES BGR (Germany)

Author keywords

BGMN; DIFFaX; Layered double hydroxide (LDH); Layered structures; Planar disorder; Rietveld refinement

Indexed keywords

EID: 62749159776 PISSN: 0930486X EISSN: None Source Type: Journal
DOI: 10.1524/zksu.2008.0020 Document Type: Conference Paper

Times cited : (34)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.