Assembly and force measurement with SPM-like probes in holographic optical tweezers

New Journal of Physics

Volumn 11, Issue , 2009, Pages

  Ikin, L ^a   Carberry, D M ^a   Gibson, G M ^b   Padgett, M J ^b   Miles, M J ^b  

^a UNIVERSITY OF BRISTOL   (United Kingdom)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM; FORCE MEASUREMENT; OPTICAL INSTRUMENTS; OPTICAL MICROSCOPY; PROBES; SCANNING PROBE MICROSCOPY; SILICA;

APPLIED FORCES; CADMIUM SULPHIDES; FORCE SENSITIVITIES; HOLOGRAPHIC OPTICAL TWEEZERS; NANO-TOOLS; OPTICAL ASSEMBLIES; OPTICALLY CONTROLLED; SCANNING-PROBE MICROSCOPIES; SILICA MICROSPHERES; TRAP STIFFNESS;

OPTICAL TWEEZERS;

EID: 62649118232     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/11/2/023012     Document Type: Article

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