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Volumn 92, Issue 3, 2009, Pages 671-674

Do grain boundaries affect microwave dielectric loss in oxides?

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC CAPACITORS; CERAMIC MATERIALS; CRYSTAL IMPURITIES; DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIELECTRIC MATERIALS; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MAGNESIUM; MICROWAVES; OXYGEN; OXYGEN VACANCIES;

EID: 62549112584     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2009.02932.x     Document Type: Article
Times cited : (140)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.