Dielectric loss of oxide single crystals and polycrystalline analogues from 10 to 320 K

Journal of the European Ceramic Society

Volumn 21, Issue 15, 2001, Pages 2605-2611

  Alford, N Mc N ^a   Breeze, J ^a   Wang, X ^a   Penn, S J ^a   Dalla, S ^a   Webb, S J ^a   Ljepojevic, N ^a   Aupi, X ^a  

^a LONDON SOUTH BANK UNIVERSITY   (United Kingdom)

Author keywords

Defects; Dielectric properties; Grain size; Microwave properties; Porosity

Indexed keywords

CRYSTAL DEFECTS; DIELECTRIC LOSSES; GRAIN BOUNDARIES; MICROWAVES; POLYCRYSTALLINE MATERIALS;

MICROWAVE DIELECTRIC LOSSES;

SINGLE CRYSTALS;

MICROWAVE RADIATION;

EID: 0035209736     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00324-7     Document Type: Article

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