Soft X-ray core-level photoemission study of boron sites in heavily boron-doped diamond films

Journal of the Physical Society of Japan

Volumn 78, Issue 3, 2009, Pages

  Okazaki, Hiroyuk ^a   Yoshida, Rikiya ^a   Muro, Takayuki ^b   Wakita, Takanori ^a   Hirai, Masaaki ^a   Muraoka, Yuji ^a,c   Takano, Yoshihiko ^d   Iriyama, Shingo ^e   Kawarada, Hiroshi ^e   Oguchi, Tamio ^f   Yokoya, Takayoshi ^a,c  

^a OKAYAMA UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^d NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^e WASEDA UNIVERSITY   (Japan)

^f HIROSHIMA UNIVERSITY   (Japan)

Author keywords

Core level; Photoemission spectroscopy; Superconducting materials

Indexed keywords

EID: 62549109561     PISSN: 00319015     EISSN: 13474073     Source Type: Journal    
DOI: 10.1143/JPSJ.78.034703     Document Type: Article

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